APSC 784 - Imaging Methods

Spring Credits: (3) Prerequisite(s): consent of instructor.

Fundamentals and applications of the two complementary families of imaging techniques: optical microscopy and scanning probe methods. Topics covered include geometric and wave optics, optical imaging, basic forms of light–matter interaction, all major optical microscopy modes (including fluorescence and confocal), interfacial forces, atomic force microscopy, scanning tunneling microscopy, and near-field optics.