APSC 528 - Scanning Probe Nanoengineering: Visualization and Manipulation of Matter at Atomic Scales

Fall Credits: (3) Schniepp. Prerequisite(s): Instructor approval.

The ability to engineer smaller and smaller structures and devices has enabled great progress across many disciplines ranging from microelectronics to biomedicine. Scanning probe techniques, including scanning tunneling microscopy and atomic force microscopy, have been transformational and inspiring tools to visualize, study, and govern the nanocosmos: they have allowed us not only to image structures of atomic dimensions but also helped us to measure molecular-scale forces and interactions, and they have enabled manipulation, building, and milling of things at the nanoscale. This class covers the fundamental relationships governing the interactions of objects and structures at such small length scales. Connections are made between nanoscale behavior of materials and their practical consequences for everyday macroscale phenomena. Designs, imaging modes and capabilities of the scanning probe microscopes are discussed, as well as their application for nanoengineering and sensing. These techniques are discussed in the context of many other micro- and nanoscale manufacturing methods, which are also introduced. The class includes hands-on computer simulations and a hands-on tour of a state-of-the-art scanning probe microscopy laboratory.